{"id":82310,"date":"2024-10-18T03:03:54","date_gmt":"2024-10-18T03:03:54","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-iec-61671-2012\/"},"modified":"2024-10-24T19:49:46","modified_gmt":"2024-10-24T19:49:46","slug":"ieee-iec-61671-2012","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-iec-61671-2012\/","title":{"rendered":"IEEE IEC 61671 2012"},"content":{"rendered":"
– Active. This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format adhering to the extensible markup language (XML) standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | IEC 61671 (IEEE Std 1671) Front Cover <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | IEC FOREWORD <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | IEEE Introduction Notice to users Laws and regulations <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Copyrights Updating of IEEE documents Errata Interpretations Patents <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Untitled Important Notice 1. Overview 1.1 General <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 1.2 Scope 1.3 Purpose <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 1.4 Application <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 1.5 Conventions used in this document <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 2. Normative references <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 4. Automatic test system (ATS) architecture 4.1 Automatic test equipment (ATE) <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 4.2 Test program set (TPS) <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 4.3 Automatic diagnosis and testing <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 5. Automatic test markup language (ATML) <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 5.1 ATS architecture elements addressed by ATML <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | 6. The ATML framework 6.1 External interfaces <\/td>\n<\/tr>\n | ||||||
35<\/td>\n | 6.2 Internal models 6.3 Services <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | 7. ATML specification techniques 7.1 ATML common element partitioning <\/td>\n<\/tr>\n | ||||||
40<\/td>\n | 7.2 ATML XML schemas 7.3 XML schemas and their use in ATML 7.4 UML models <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | 8. The ATML framework subdomains 8.1 The ATML framework and ATML family component standards 8.2 ATML subdomains <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | 9. ATML XML schema names and locations <\/td>\n<\/tr>\n | ||||||
51<\/td>\n | 10. ATML XML schema extensibility <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | 11. Conformance 11.1 ATML family XML schemas 11.2 The ATML framework <\/td>\n<\/tr>\n | ||||||
58<\/td>\n | Annex A (normative) XML schema style guidelines A.1 Naming conventions <\/td>\n<\/tr>\n | ||||||
60<\/td>\n | A.2 XML declaration A.3 ATML namespaces <\/td>\n<\/tr>\n | ||||||
62<\/td>\n | A.4 Versioning <\/td>\n<\/tr>\n | ||||||
63<\/td>\n | A.5 Documentation <\/td>\n<\/tr>\n | ||||||
64<\/td>\n | A.6 Design <\/td>\n<\/tr>\n | ||||||
67<\/td>\n | Annex B (normative) ATML common element schemas B.1 Common element schema\u2014Common.xsd <\/td>\n<\/tr>\n | ||||||
148<\/td>\n | B.2 Common element schema\u2014HardwareCommon.xsd <\/td>\n<\/tr>\n | ||||||
239<\/td>\n | B.3 Common element schema\u2014TestEquipment.xsd <\/td>\n<\/tr>\n | ||||||
270<\/td>\n | Annex C (normative) ATML internal model schemas C.1 ATML internal model schema\u2014Capabilities.xsd <\/td>\n<\/tr>\n | ||||||
272<\/td>\n | C.2 ATML internal model schema\u2014WireLists.xsd <\/td>\n<\/tr>\n | ||||||
279<\/td>\n | Annex D (normative) ATML runtime services D.1 Messages D.2 Executive system service <\/td>\n<\/tr>\n | ||||||
280<\/td>\n | D.3 Example WSDL service definition <\/td>\n<\/tr>\n | ||||||
281<\/td>\n | Annex E (informative) Pins, ports, connectors, and wire lists in ATML E.1 Introduction <\/td>\n<\/tr>\n | ||||||
282<\/td>\n | E.2 Overview of the base types <\/td>\n<\/tr>\n | ||||||
285<\/td>\n | E.3 Using ports, pins, and connectors together <\/td>\n<\/tr>\n | ||||||
287<\/td>\n | E.4 Ports, pins, and capabilities <\/td>\n<\/tr>\n | ||||||
290<\/td>\n | E.5 Wire lists <\/td>\n<\/tr>\n | ||||||
295<\/td>\n | Annex F (informative) ATML capabilities F.1 Introduction <\/td>\n<\/tr>\n | ||||||
297<\/td>\n | F.2 Overview <\/td>\n<\/tr>\n | ||||||
301<\/td>\n | F.3 Describing instrument capabilities <\/td>\n<\/tr>\n | ||||||
340<\/td>\n | F.4 Describing ATS capabilities <\/td>\n<\/tr>\n | ||||||
344<\/td>\n | F.5 Capability information in ATML Test Description <\/td>\n<\/tr>\n | ||||||
351<\/td>\n | Annex G (informative) IEEE download Web site material associated with this document <\/td>\n<\/tr>\n | ||||||
352<\/td>\n | Annex H (informative) ATS architectures H.1 ATS architectures utilization of published standards <\/td>\n<\/tr>\n | ||||||
355<\/td>\n | H.2 ATS architectural relationships to IEEE SCC20-based standards H.3 ATS architectural ATML subdomain relationship to SIMICA standards <\/td>\n<\/tr>\n | ||||||
359<\/td>\n | Annex I (informative) Architecture examples I.1 Instruments <\/td>\n<\/tr>\n | ||||||
360<\/td>\n | I.2 Test descriptions <\/td>\n<\/tr>\n | ||||||
362<\/td>\n | I.3 Complete testing scenario <\/td>\n<\/tr>\n | ||||||
375<\/td>\n | I.4 Integrated ATML system <\/td>\n<\/tr>\n | ||||||
379<\/td>\n | Annex J (informative) UML models J.1 Generic ATS testing of a UUT <\/td>\n<\/tr>\n | ||||||
381<\/td>\n | J.2 ATML XML schema relationships <\/td>\n<\/tr>\n | ||||||
384<\/td>\n | Annex K (informative) Glossary <\/td>\n<\/tr>\n | ||||||
387<\/td>\n | Annex L (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
391<\/td>\n | Annex M (informative) IEEE List of Participants <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEC 61671:2012(E) (IEEE Std 1671-2010) Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML<\/b><\/p>\n |