{"id":409062,"date":"2024-10-20T05:33:46","date_gmt":"2024-10-20T05:33:46","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-237292022\/"},"modified":"2024-10-26T10:11:05","modified_gmt":"2024-10-26T10:11:05","slug":"bs-iso-237292022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-237292022\/","title":{"rendered":"BS ISO 23729:2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4 Symbols (and abbreviated terms) 5 Mathematical morphology modelling <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 6 Procedure of restoration of AFM topography images 6.1 General 6.2 Calibration of measuring systems <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.3 Environment requirements 6.4 Extraction of probe tip shape using certified reference materials 6.5 Estimation of probe tip shape by blind reconstruction <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6.6 Reference materials 6.7 Probe shape characteristic and curvature radius 6.8 Validity test for topography image restoration <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | Annex A (informative) Example studies <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Annex B (informative) Results of interlaboratory comparison <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size<\/b><\/p>\n |