{"id":236469,"date":"2024-10-19T15:26:04","date_gmt":"2024-10-19T15:26:04","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-60444-62013\/"},"modified":"2024-10-25T10:03:13","modified_gmt":"2024-10-25T10:03:13","slug":"bs-en-60444-62013","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-60444-62013\/","title":{"rendered":"BS EN 60444-6:2013"},"content":{"rendered":"
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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6<\/td>\n | English CONTENTS <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 DLD effects 3.1 Reversible changes in frequency and resistance 3.2 Irreversible changes in frequency and resistance <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | 3.3 Causes of DLD effects 4 Drive levels for DLD measurement <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 5 Test methods 5.1 Method A (Fast standard measurement method) 5.1.1 Testing at two drive levels 5.1.2 Testing according to specification <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5.2 Method B (Multi-level reference measurement method) Figure 1 \u2013 Maximum tolerable resistance ratio \u03b3 for the drive level dependence as a function of the resistances Rr2 or Rr3 <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | Annex A (normative) Relationship between electrical drive level and mechanical displacement of quartz crystal units <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex B (normative) Method C: DLD measurement with oscillation circuit Figure B.1 \u2013 Insertion of a quartz crystal unit in an oscillator <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | Figure B.2 \u2013 Crystal unit loss resistance as a function of dissipated power <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | Figure B.3 \u2013 Behaviour of the Rr of a quartz crystal units Figure B.4 \u2013 Block diagram of circuit system <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | Figure B.5 \u2013 Installed \u2212Rosc in scanned drive level range Figure B.6 \u2013 Drive level behavior of a quartz crystal unit if \u2212Rosc = 70 \u03a9 is used as test limit in the \u201cAnnex B\u201d test <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Figure B.7 \u2013 Principal schematic diagram of the go\/no-go test circuit <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Measurement of quartz crystal unit parameters – Measurement of drive level dependence (DLD)<\/b><\/p>\n |