{"id":123906,"date":"2024-10-19T04:51:18","date_gmt":"2024-10-19T04:51:18","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/astm-f1893-4\/"},"modified":"2024-10-24T23:07:50","modified_gmt":"2024-10-24T23:07:50","slug":"astm-f1893-4","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/astm\/astm-f1893-4\/","title":{"rendered":"ASTM-F1893"},"content":{"rendered":"<\/p>\n
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.<\/p>\n
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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1<\/td>\n | Scope Referenced Documents Terminology Summary of Guide <\/td>\n<\/tr>\n | ||||||
2<\/td>\n | Significance and Use Interferences Apparatus <\/td>\n<\/tr>\n | ||||||
4<\/td>\n | Preparation of Apparatus Procedure <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Report Keywords <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" F1893-98(2003) Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices<\/b><\/p>\n |