ISO 20263:2017

$46.15

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

Published By	Publication Date	Number of Pages
ISO	2017-11	52

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Categories: 37.020 - Optical equipment, 71.040.50 - Physicochemical methods of analysis, ISO

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Description

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

Additional information

Published Code	ISO
Published By	International Organization for Standardization
Publication Date	2017-11
Pages Count	52
Language	English
Edition	1
File Size	4.5 MB
ICS Codes	37.020 - Optical equipment 71.040.50 - Physicochemical methods of analysis

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ISO 20263:2017

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