IEEE IEC 61671 2 2016
$39.00
IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description
| Published By | Publication Date | Number of Pages |
| IEEE | 2016 | 56 |
– Active. An exchange format is specified in this standard, using extensible markup language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 1 | IEC 61671-2-2016, IEC Adoption of IEEE Std 1671.2-2012 Front Cover |
| 4 | CONTENTS |
| 5 | FOREWORD |
| 9 | INTRODUCTION |
| 13 | Important Notice 1. Overview 1.1 General |
| 14 | 1.2 Application of this document’s annexes 1.3 Scope 1.4 Application |
| 15 | 1.5 Conventions used within this document |
| 16 | 2. Normative references 3. Definitions, abbreviations, and acronyms 3.1 Definitions |
| 17 | 3.2 Abbreviations and acronyms |
| 19 | 4. InstrumentDescription schema 4.1 General 4.2 Elements |
| 22 | 4.3 Child elements |
| 25 | 4.4 Complex types |
| 40 | 4.5 Simple types 5. InstrumentDescription instance schema 5.1 Elements |
| 41 | 5.2 Complex types |
| 43 | 5.3 Simple types 6. ATML InstrumentDescription XML schema names and locations |
| 45 | 7. ATML XML schema extensibility 8. Conformance |
| 46 | Annex A (informative) IEEE download Web site material associated with this document |
| 47 | Annex B (informative) Users information and examples B.1 Usage within an automatic test station |
| 48 | B.2 Instruments with calibration, capabilities, or triggering B.3 Instrument options B.4 Capabilities |
| 49 | B.5 Pins, ports, and connectors B.6 Specifications represented by graphs B.7 Parallel measurements (traces) |
| 50 | Annex C (informative) Glossary |
| 51 | Annex D (informative) Bibliography |
| 53 | Annex E (informative) IEEE List of Participants |
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