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IEEE 522 2004

$37.38

IEEE Guide for Testing Turn Insulation of Form-Wound Stator Coils for Alternating-Current Electric Machines

Published By Publication Date Number of Pages
IEEE 2004 26
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Revision Standard – Active. Revision of IEEE Std 522-1992 Suggestions are made for testing the dielectric strength of the insulation separating the various turns from each other within multiturn form-wound coils to determine their acceptability. Typical ratings of machines employing such coils normally lie within the range of 200 kW to 100 mW (270 hp to 135 000 hp). The test levels described do not evaluate the ability of the turn insulation to withstand abnormal voltage surges, only surges associated with normal operation. The suggestions apply to: (1) individual stator coils after manufacture; (2) coils in completely wound stators; (3) coils and windings for rewinds of used machinery; and (4) windings of machines in service to determine their suitability for further service (preventive-maintenance testing). Coil service conditions, test devices, and test sequence are discussed.

PDF Catalog

PDF Pages PDF Title
1 Cover page
3 Title page
5 Introduction
6 Participants
8 CONTENTS
9 1. Overview
1.1 Scope
1.2 Purpose
2. References
10 3. Service conditions
3.1 Operating stress
3.2 Transient stress
3.3 Withstand requirements
11 4. Suggested test devices
4.1 Test requirements
4.2 Suitable devices
4.2.1 Conduction-type devices
4.2.2 Induction-type devices
5. Test procedure
5.1 Test sequences
12 5.2 Test conditions
5.3 Voltage levels
6. Surge test levels for new coils
6.1 General
13 6.2 Standard (3.5 p.u.) withstand envelope
14 6.3 Alternate withstand envelope
6.4 Definition of surge envelopes
6.5 Abnormal surges
6.6 Precautions
15 6.7 Reduction in test levels for uncured coils
7. Maintenance tests or tests after installation of machines
7.1 Test voltage level
7.2 Conduction-type devices
7.3 Induction-type devices
7.4 Insufficient coupling
7.5 Other methods/further details
16 Annex A—Test procedures and methods
21 Annex B—Sample test form
23 Annex C—Bibliography
IEEE 522 2004
$37.38