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BSI PD IEC TS 62876-2-1:2018

BSI PD IEC TS 62876-2-1:2018

$167.15

Nanotechnology. Reliability assessment – Nano-enabled photovoltaic devices. Stability test

Published By Publication Date Number of Pages
BSI 2018 34
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This part of IEC 62876, which is a Technical Specification, establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nanoenabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

NOTE 1 The tests in this document are selected with outdoor use in mind, and as such represent isolated stress factors that devices will be exposed to in outdoor environments. For indoor environments, the stresses faced by the devices in operation are significantly less severe, and not all tests will be applicable. Despite this, the suggested tests provide a means of tracking stability improvements and can provide valuable data during device development.

NOTE 2 The performance of devices will be evaluated before and after the application of the stress tests. The efficiency characterization methods for NePV have not been fully established at present. In the text, notes are therefore added regarding the efficiency characterization. The notes particularly address issues to be discussed in the future for applications such as indoor use, or devices with a slow response or uncommon spectral responses such as tandem cells.

NOTE 3 The scope does not include photovoltaic modules, i.e. the final product. It is only intended to test the technology.

PDF Catalog

PDF Pages PDF Title
2 undefined
4 CONTENTS
7 FOREWORD
9 INTRODUCTION
10 Figures
Figure 1 – Generic representation of a device under test during IV-characterization
11 1 Scope
2 Normative references
12 3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
13 3.2 Abbreviated terms
4 General requirements
4.1 Device
14 4.2 Tests
4.2.1 General
Figure 2 – Overview of stresses that photovoltaic devices are exposed to in service environments
15 Figure 3 – General stability test procedure
Tables
Table 1 – Summary of the stresses utilized in this document
16 4.2.2 Quantity of specimens
4.2.3 Sequence
4.2.4 Equipment specifications
4.2.5 Test methods
Figure 4 – Overview of the stability assessment tests that are recommended for standard testing in order to assess the stability of NePV
17 4.3 Measurements
4.3.1 General
4.3.2 Conditioning
Table 2 – Summary overview of the relevant test methods and main control parameters.
18 4.3.3 Visual inspection
4.3.4 Data collection
4.3.5 Pass/fail criteria
19 5 Test methods
5.1 ST1 – Dry heat
5.1.1 Purpose
5.1.2 Temperature/humidity
5.1.3 Data logging
5.1.4 Output
5.1.5 Required equipment
5.2 ST2 – UV exposure
5.2.1 Purpose
5.2.2 Radiation source
20 5.2.3 Temperature/humidity
5.2.4 Data logging
5.2.5 Output
5.2.6 Required equipment
5.3 ST3 – Damp heat
5.3.1 Purpose
5.3.2 Procedure
5.3.3 Temperature/humidity
5.3.4 Data logging
21 5.3.5 Output
5.3.6 Required equipment
5.4 ST4 – Light exposure
5.4.1 Purpose
5.4.2 Light source
5.4.3 Devices and load condition
5.4.4 Temperature
5.4.5 Humidity at ambient conditions
5.4.6 Data logging
22 5.4.7 Output
5.4.8 Required equipment
5.5 ST5 – Outdoor exposure
5.5.1 Purpose
5.5.2 Locations
5.5.3 Solar irradiance
5.5.4 Devices
5.5.5 Temperature
5.5.6 Load condition
23 5.5.7 Humidity/wind
5.5.8 Data logging
5.5.9 Output
5.5.10 Required equipment
5.6 ST6 – Laboratory weathering
5.6.1 Purpose
5.6.2 Temperature/humidity/light
5.6.3 Devices
Table 3 – Exposure parameters according to ISO 4892-2:2013, Table 3, cycle 1
24 5.6.4 Load condition
5.6.5 Data logging
5.6.6 Output
5.6.7 Required equipment
5.7 ST7 – Thermal cycling
5.7.1 Purpose
5.7.2 Temperature/humidity
5.7.3 Data logging
25 5.7.4 Output
5.7.5 Required equipment
6 Report
Figure 5 – Plot of the temperature cycle to be used for thermal cycling.
27 Annex A (informative)Overview of common failure modes –Failure mode and known failure mechanismsfor nano-enabled photovoltaic devices
28 Annex B (informative)Stability test temperature choice – How to choosethe best temperature for stability testing of new technologies
29 Annex C (informative)Correspondence between ISOS protocols and the stability test fornano-enabled photovoltaic devices outlined in this document
30 Table C.1 – Overview of the tests described in this document,in comparison to the tests recommended in ISOS 2009 and ISOS 2011
32 Bibliography

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