BSI PD CLC/TS 50625-3-3:2017
$167.15
Collection, logistics & treatment requirements for WEEE – Specification for de-pollution. WEEE containing CRTs and flat panel displays
| Published By | Publication Date | Number of Pages |
| BSI | 2017 | 38 |
Clause 1 of CLC/TS 50625-3-1:2015 is replaced with the following:
This European Technical Specification is intended to be used in conjunction with Collection, logistics and treatment requirements for WEEE — Part 1: General treatment requirements, EN 50625-1, Collection, logistics and Treatment requirements for WEEE — Part 2-2: Treatment requirements for WEEE containing CRTs and flat panel displays, EN 50625-2-2 and Collection, logistics and treatment requirements for WEEE — Part 3-1: Specification for de-pollution — General, CLC/TS 50625-3-1.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 2 | National foreword |
| 9 | 1 Scope 2 Normative references |
| 10 | 3 Terms and definitions 4 De-pollution monitoring 4.1 Introduction 4.2 Target value methodology 4.3 Mass Balance methodology |
| 11 | 4.4 Analysis methodology 4.101 Monitoring methodology 4.101.1 Introduction 4.101.2 CRT equipment |
| 12 | 4.101.3 Flat Panel Display (FPD) 5 Overview of the applicable methodologies – Applicable methodologies 6 Large appliances 7 Cooling and freezing appliances |
| 13 | 8 CRT Display / FPD appliances 8.1 Introduction 8.2 CRT display appliances – Target value methodology 8.3 CRT display appliances – Analysis methodology 8.3.101 Residual CRT glass in CRT fractions |
| 14 | 8.3.102 Fluorescent coating remaining on cleaned CRT glass 8.3.103 Lead content in separated panel glass 8.4 FPD appliances – Mass balance methodology 8.4.101 Introduction |
| 15 | 8.4.102 Procedure 8.4.103 Results |
| 16 | 8.5 FPD appliances – Analysis methodology 9 Lamps – introduction and analysis methodology 10 Small appliances |
| 17 | 11 Protocol for components removed during a batch process 11.1 General procedure 11.2 Capacitors 11.3 Batteries |
| 18 | Annex A (normative)Sampling protocol for the physically smallest non-metallic mechanical treatment fraction |
| 19 | Annex B (normative)Sampling protocol for plastics |
| 20 | Annex C (normative)Targets |
| 21 | Annex D (informative)Target calculation example – Calculation example for large appliance |
| 22 | Annex AA (normative)CRT and FPD: Sampling protocol AA.1 Introduction AA.2 Sample number and size AA.2.1 Deflection coils and electron canons from CRT treatment AA.2.2 Ferrous metal fraction from CRT treatment AA.2.3 Sampling procedure for lead oxide analysis on panel glass |
| 23 | AA.2.4 Sampling procedure for the sulphur analysis on cleaned CRT glass AA.2.5 Sampling procedure for crushed or shredded mixed fractions from CRT and FPD AA.3 Principles of sampling and sample preparation AA.4 Packaging, storing and sending of samples |
| 25 | Annex BB (normative)CRT: Analysis protocol for residual CRT glass in CRT fractions BB.1 Analysis BB.2 Calculation of the residual CRT glass in fractions |
| 26 | Annex CC (normative)CRT: Analysis protocol for fluorescent coating remaining on cleaned CRT glass CC.1 Introduction CC.2 Visual inspection protocol CC.3 Chemical analysis protocol CC.3.1 General |
| 27 | CC.3.2 Test portion preparation CC.3.3 Leaching step CC.3.4 Leaching procedure CC.3.5 Quantification technique |
| 28 | CC.3.6 Sulphur standard |
| 29 | Annex DD (normative)CRT: Analysis protocol for the lead oxide in separated panel glass DD.1 General DD.2 Analysis by XRF method (onsite analysis) |
| 30 | DD.3 Analysis by XRF method (laboratory analysis) DD.4 Analysis by ICP OES method DD.5 Reporting |
| 31 | Annex EE (normative)FPD: Main steps for Mass Balance EE.1 Preparation of the reference batch EE.2 Treatment of the reference batch for a manual treatment process EE.3 Calculation for manual treatment EE.3.1 Description of the parameters EE.3.2 Formulas |
| 32 | EE.4 Calculation and validation for mechanical treatment EE.4.1 Description of the parameters EE.4.2 Formulas |
| 33 | Annex FF (normative)FPD: Analysis of the de-polluted physically smallest shredded mix fraction of flat panel displays FF.1 Principles FF.2 Verification FF.3 Test portion preparation |
| 34 | FF.4 Mineralisation FF.5 Analytical technique |
| 35 | Annex GG (informative)CRT: Background on analysis protocol for fluorescent coating remaining on cleaned CRT glass |
