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BSI PD CEN ISO/TS 23302:2022

BSI PD CEN ISO/TS 23302:2022

$215.11

Nanotechnologies. Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them

Published By Publication Date Number of Pages
BSI 2022 82
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PDF Catalog

PDF Pages PDF Title
2 undefined
4 European foreword
Endorsement notice
9 Foreword
10 Introduction
11 1 Scope
2 Normative references
3 Terms and definitions
3.1 General core terms
13 3.2 Measurand related terms
16 4 Abbreviated terms
19 5 Approaches to identify measurands to characterize nano-objects and their agglomerates and aggregates, and materials containing nano-objects
5.1 Procedure
20 5.2 Types of measurands
5.3 State of nano-objects
21 6 Measurands related to size and shape measurement of nano-objects and their agglomerates and aggregates
6.1 General
6.2 Measurands related to size and shape measurement
6.2.1 Overview
22 6.2.2 General relevant standards
6.3 Measurands related to size and shape measurement in aerosols
6.3.1 Overview
23 6.3.2 General relevant standards
6.3.3 Electrical low-pressure impaction
24 6.3.4 Cascade impactors
6.3.5 Differential mobility analysing system
25 6.3.6 Relevant standards
6.3.7 Optical particle counter
6.3.8 Relevant standards
6.3.9 Aerodynamic particle sizing
6.3.10 TEM combined with TEM grid samplers
26 6.3.11 Relevant standards
6.3.12 Scanning electron microscopy
27 6.3.13 Relevant standards
6.4 Measurands related to size and shape measurement in powders
6.4.1 Overview
6.4.2 Relevant standards
28 6.4.3 Scanning electron microscopy
6.4.4 Relevant standards
6.4.5 Gas adsorption, the BET method
6.4.6 Relevant standard
6.4.7 Laser diffraction
29 6.4.8 Relevant standard
6.4.9 X-ray diffraction
6.4.10 Relevant standards
6.4.11 Raman spectroscopy
30 6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions
6.5.1 Overview
31 6.5.2 Centrifugal liquid sedimentation
6.5.3 Relevant standards
6.5.4 Dynamic light scattering
32 6.5.5 Relevant standards
6.5.6 Laser diffraction
6.5.7 Relevant standard
6.5.8 Small angle X-ray scattering
6.5.9 Relevant standard
6.5.10 Particle tracking analysis
33 6.5.11 Relevant standards
6.5.12 Electron microscopy
6.5.13 Field flow fractionation
34 6.5.14 Relevant standard
6.5.15 Single particle ICP-MS
35 6.5.16 Relevant standard
6.6 Measurands related to size and shape measurement on surfaces (microscopy techniques)
6.6.1 Overview
6.6.2 Scanning electron microscopy
6.6.3 Atomic force microscopy
36 6.6.4 Relevant standards
7 Measurands related to chemical analysis of nano-objects and their agglomerates and aggregates
7.1 General
37 7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates and aggregates
7.2.1 Measurands
38 7.2.2 Auger electron spectroscopy
7.2.3 Relevant standards
7.2.4 Electron energy loss spectroscopy
7.2.5 Relevant standard
7.2.6 Secondary ion mass spectroscopy
39 7.2.7 Relevant standards
7.2.8 X-ray fluorescence spectroscopy
40 7.2.9 Relevant standards
7.2.10 X-ray diffraction
7.2.11 Relevant standard
7.2.12 X-ray photoelectron spectroscopy
41 7.2.13 Relevant standards
7.2.14 Energy dispersive X-ray spectroscopy
7.2.15 Low energy ion scattering
7.3 Measurands related to the chemical analysis of nano-objects as bulk samples
7.3.1 Measurands
42 7.3.2 Fourier transform infrared spectroscopy
43 7.3.3 Relevant standards
7.3.4 Thermal analysis with evolved gas analyser plus FTIR or QMS
44 7.3.5 Relevant standards
7.3.6 Ultraviolet–visible spectroscopy
7.3.7 Relevant standards
7.3.8 Raman spectroscopy
7.3.9 Inductively coupled plasma techniques
7.3.10 Relevant standards
45 7.3.11 Contact angle
8 Measurands related to mass and density
8.1 General
8.2 Aerosols
8.2.1 Measurands
8.2.2 Relevant standards
46 8.2.3 Aerosol particle mass analyser
8.2.4 Time of flight mass spectrometry
8.3 Powders
8.3.1 Measurands
8.3.2 Pycnometry
8.3.3 Relevant standards
47 8.4 Liquid dispersions
8.4.1 Measurands
8.4.2 Relevant standards
8.4.3 Centrifugal liquid sedimentation (isopycnic method)
8.4.4 Static light scattering
48 8.4.5 Resonant mass measurement
9 Measurands related to charge — Liquid dispersions
9.1 Measurands
9.2 Relevant standards
9.3 Electrophoretic light scattering
49 9.4 Electroacoustic phenomena measurements
10 Measurands related to crystallinity
10.1 Measurands
50 10.2 Small-angle/wide-angle X-ray scattering
10.3 X-ray diffraction
51 10.4 High-resolution transmission electron microscopy
10.5 Electron backscattered diffraction
10.6 Neutron diffraction
10.7 Reflection high-energy electron diffraction and low-energy electron diffraction
10.8 Differential scanning calorimetry
52 10.9 Relevant standards
10.10 Solid state nuclear magnetic resonance crystallography
10.11 Raman crystallography
10.12 Relevant standards
11 Optical properties measurands
11.1 General
53 11.2 Measurands
11.3 Spectroscopy techniques
54 11.4 Relevant standards
12 Electrical and electronic measurands
12.1 Measurands
55 12.2 Techniques
12.2.1 2- or 4-point conductance measurements
12.2.2 Angle-resolved ultraviolet photoemission spectroscopy
12.2.3 Scanning tunnelling microscopy
12.2.4 Conductive atomic force microscopy
56 12.2.5 Piezoforce microscopy
13 Magnetic measurands
13.1 General
13.2 Measurands
57 13.3 Techniques
13.3.1 Superconducting quantum interference device
58 13.3.2 Vibrating sample magnetometer
13.3.3 Mössbauer spectroscopy
13.3.4 Electron paramagnetic resonance spectroscopy
13.3.5 Magneto-optical Kerr-effect
13.3.6 Magnetic force microscopy
13.3.7 Scanning Hall effect microscopy
59 13.3.8 Spin-polarized scanning tunnelling microscopy
13.3.9 Relevant standards
14 Thermal measurands
14.1 Measurands
14.2 Techniques
14.2.1 Measurement of specific heat capacity
14.2.2 Scanning thermal microscopy
60 14.3 Relevant standard
15 Other performance related measurands
15.1 General
15.2 Powders — Dustiness
15.2.1 Measurands
15.2.2 Relevant standards
61 15.3 Liquid dispersions
15.3.1 Measurands
15.3.2 Viscosity
63 15.3.3 Dispersibility
15.3.4 Relevant standard
15.3.5 Solubility and rate of dissolution
64 15.3.6 Relevant standards
15.4 Mechanical properties
15.4.1 General
65 15.4.2 Measurement of elastic constants by static methods
15.4.3 Relevant standards
15.4.4 Measurement of elastic constants by dynamic methods
66 15.4.5 Relevant standards
15.4.6 Measurement of elastic and plastic properties by instrumented indentation methods
15.4.7 Relevant standards
15.4.8 Measurement of surface properties and wear
67 15.4.9 Relevant standard
68 Bibliography

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BSI PD CEN ISO/TS 23302:2022
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