BSI DD ISO/TS 10798:2011
$167.15
Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
| Published By | Publication Date | Number of Pages |
| BSI | 2011 | 38 |
This Technical Specification establishes methods to characterize the morphology, and to identify the elemental composition of, catalysts and other inorganic impurities in raw and purified single-wall carbon nanotube (SWCNT) powders and films, using scanning electron microscopy and energy dispersive X-ray spectrometry analysis.
The methods described here for SWCNTs can also be applied to the analysis of multiwall carbon nanotubes (MWCNTs).
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 9 | 1 Scope 2 Normative references 3 Terms and definitions 3.1 Terms related to scanning electron microscope |
| 10 | 3.2 Terms related to electron probe microanalysis |
| 11 | 3.3 Terms related to sampling |
| 12 | 4 General principles 4.1 SEM analysis 4.2 EDX analysis 4.3 Applicability to MWCNT analysis |
| 13 | 4.4 Other supportive analytical methods 5 Sample preparation methods 5.1 Precautions and safety concerns 5.2 Preparing samples for SEM/EDX analysis 5.2.1 Sample preparation protocols 5.2.2 Sample selection |
| 14 | 5.2.3 Types of CNT samples 5.3 SEM sample preparation/attachment techniques 5.3.1 Double-sided carbon tape method (dry method) 5.3.2 Pressing powder into indium foil (dry method) |
| 15 | 5.3.3 Solvent dispersion on suitable substrates (wet method) 6 Measurement procedures 6.1 SEM analysis |
| 16 | 6.2 EDX analysis |
| 17 | 7 Data analysis and results interpretation 7.1 SEM results 7.2 EDX results 8 Measurement uncertainty 8.1 SEM analysis |
| 18 | 8.2 EDX analysis |
