BSI DD IEC/PAS 60679-6:2008

$102.76

Quartz crystal controlled oscillators of assessed quality – Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide

Published By	Publication Date	Number of Pages
BSI	2008	22

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Description

IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

Additional information

Status	Withdrawn
Title	Quartz crystal controlled oscillators of assessed quality – Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
Publisher	BSI
Committee	W/-
Pages	22
Publication Date	2008-05-30
Withdrawn Date	2011-06-30
Replaced By	BS EN 60679-6:2011
ISBN	978 0 580 62340 0
Standard Number	DD IEC/PAS 60679-6:2008
Identical National Standard Of	IEC/PAS 60679-6:2008
Descriptors	Electrical wave measurement, Phase measurement (electric), Crystal resonators, Noise (spurious signals), Oscillators, Electronic equipment and components, Quartz, Crystals (electronic), Assessed quality, Piezoelectric devices
ICS Codes	31.140 - Piezoelectric devices

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BSI DD IEC/PAS 60679-6:2008

$102.76


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