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BS EN IEC 63287-2:2023

BS EN IEC 63287-2:2023

$102.76

Semiconductor devices. Guidelines for reliability qualification plans – Concept of mission profile

Published By Publication Date Number of Pages
BSI 2023 22
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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

PDF Catalog

PDF Pages PDF Title
2 undefined
5 Annex ZA (normative)Normative references to international publicationswith their corresponding European publications
6 Blank Page
7 English
CONTENTS
8 FOREWORD
10 1 Scope
2 Normative references
3 Terms and definitions
4 Mission profile
4.1 Concept of mission profile
11 4.2 Example of reliability test plan considering the mission profile of automotive engine peripherals application (1)
Figure 1 – Example of mission profile for automotive application
12 Tables
Table 1 – Trial calculation example of equivalent time under operating life test based on consideration of the mission profile (automotive application in the engine peripheral)
Table 2 – Trial calculation example of number of samples/test time of operating life test with consideration of the mission profile (Automotive application in the engine peripheral)
13 4.3 Example of reliability test plan considering the mission profile of automotive engine peripherals application (2)
Table 3 – Trial calculation example of equivalent time under operating life test with consideration of the mission profile (automotive application in the engine peripheral)
14 4.4 Example of reliability test plan considering the mission profile of automotive cabin peripherals application
Table 4 – Trial calculation example of equivalent time under operating life test with consideration of the mission profile (Automotive application in the engine peripheral)
Table 5 – Trial calculation example of equivalent time under operating life test with consideration of the mission profile (automotive application in the cabin peripheral)
15 5 Calculation examples of mission profiles (Calculation of sample and test time of life tests)
Table 6 – Trial calculation example of number of samples/test timeof high temperature operating life test with consideration of the missionprofile (Automotive application in the cabin peripheral)
16 Table 7 – Calculation examples of mission profiles (Calculation of sample and test time of life tests)
18 Table 8 – Calculation examples of mission profiles (Calculation of sample and test time of life tests)
20 Bibliography

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BS EN IEC 63287-2:2023
$102.76