BS EN 62493:2015
$198.66
Assessment of lighting equipment related to human exposure to electromagnetic field
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 70 |
This International Standard applies to the assessment of lighting equipment related to human exposure to electromagnetic fields. The assessment consists of the induced internal electric field for frequencies from 20 kHz to 10 MHz and the specific absorption rate (SAR) for frequencies from 100 kHz to 300 MHz around lighting equipment.
Included in the scope of this standard are:
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all lighting equipment with a primary function of generating and/or distributing light intended for illumination purposes, and intended either for connection to the low voltage electricity supply or for battery operation; used indoor and/or outdoor;
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lighting part of multi-function equipment where one of the primary functions of this is illumination;
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independent auxiliaries exclusively for the use with lighting equipment;
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lighting equipment including intentional radiators for wireless communication or control.
Excluded from the scope of this standard are:
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lighting equipment for aircraft and airfields;
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lighting equipment for road vehicles; (except lighting used for the illumination of passenger compartments in public transport)
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lighting equipment for agriculture;
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lighting equipment for boats/vessels;
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photocopiers, slide projectors;
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apparatus for which the requirements of electromagnetic fields are explicitly formulated in other IEC standards.
The methods described in this standard are not suitable for comparing the fields from different lighting equipment.
This standard does not apply to built-in components for luminaires such as electronic controlgear.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 10 | FOREWORD |
| 12 | INTRODUCTION |
| 13 | 1 Scope 2 Normative references |
| 14 | 3 Terms, definitions, physical quantities, units and abbreviations 3.1 Terms and definitions |
| 16 | 3.2 Physical quantities and units |
| 17 | 3.3 Abbreviations 4 Limits 4.1 General Tables Table 1 – Physical quantities and units |
| 18 | 4.2 Unintentional radiating part of lighting equipment 4.2.1 General 4.2.2 Lighting equipment deemed to comply with the Van der Hoofden test without testing 4.2.3 Application of limits 4.3 Intentional radiating part of lighting equipment |
| 19 | 5 General requirements Van der Hoofden test 5.1 Measurand 5.2 Supply voltage and frequency Figures Figure 1 – Compliance routes and pass/fail criteria for lighting equipment |
| 20 | 5.3 Measurement frequency range 5.4 Ambient temperature 5.5 Measurement equipment requirements Figure 2 – The Van der Hoofden test head Table 2 – Receiver or spectrum analyser settings |
| 21 | 5.6 Measurement instrumentation uncertainty 5.7 Test report Figure 3 – Example of a protection circuit |
| 22 | 5.8 Evaluation of results 6 Measurement procedure for the Van der Hoofden test 6.1 General 6.2 Operating conditions 6.2.1 Operating conditions for lighting equipment 6.2.2 Operating conditions for specific lighting equipment |
| 23 | 6.2.3 Operating conditions for lighting equipment with intentional radiators 6.3 Measurement distance 6.4 Measurement set-up 6.4.1 General Figure 4 – Measurement set-up |
| 24 | 6.4.2 Measurement set-up for specific lighting equipment 6.5 Location of measurement test head 6.6 Calculation of the results 7 Assessment procedure intentional radiators 7.1 General 7.2 Low-power exclusion method 7.2.1 General |
| 25 | 7.2.2 Determination of the total radiated power 7.2.3 Determination of the low-power exclusion level 7.2.4 Summation of multiple transmitters 7.3 Application of the EMF product standard for body worn-equipment 7.4 Application of the EMF product standard for base stations 7.5 Application of another EMF standard |
| 26 | Figure 5 – Compliance demonstration procedure for the intentional-transmitter part of the lighting equipment |
| 27 | Annexes Annex A (normative) Measurement distances |
| 28 | Annex B (informative) Location of measurement test head Figure B.1 – Location of measurement point in the transverse direction of lighting equipment – side view Figure B.2 – Location of measurement points in the longitude direction of lighting equipment – side view |
| 29 | Figure B.3 – Location of measurement points in the longitude direction of lighting equipment; in the direction of illumination Figure B.4 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions |
| 30 | Figure B.5 – Location of measurement point for lighting equipment with rotationally symmetrical dimensions; in the direction of illumination Figure B.6 – Location of measurement point for lighting equipment with the same dimensions in the x- and y- axis Table A.1 – Lighting equipment and measurement distances |
| 31 | Figure B.7 – Location of measurement point(s) for lighting equipment with single capped lamp (360° illumination) Figure B.8 – Location of measurement points for lighting equipment with a remote controlgear |
| 32 | Figure B.9 – Location of measurement point for an independent electronic converter Figure B.10 – Location of measurement point(s) for an uplighter (floor standing/suspended) |
| 33 | Annex C (informative) Exposure limits C.1 General C.2 ICNIRP C.2.1 ICNIRP 1998 C.2.2 ICNIRP 2010 C.3 IEEE Table C.1 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies between 100 kHz and 10 GHz Table C.2 – Basic restrictions for general public exposure to time varying electric and magnetic fields for frequencies up to 10 MHz |
| 34 | Table C.3 – IEEE basic restrictions (BR) for the general public Table C.4 – IEEE basic restrictions (BR) between 100 kHz and 3 GHz for the general public |
| 35 | Annex D (informative) Rationale measurement and assessment method D.1 General D.2 Induced internal electric field D.2.1 General Figure D.1 – Overview measurement and assessment method |
| 37 | D.2.2 Induced electric field due to the magnetic field; Eeddy(fi,dloop) Figure D.2 – Distances of the head, loop and measurement set-up |
| 38 | Table D.1 – Induced internal electric field calculations |
| 39 | Figure D.3 – Maximum current in the 2 m LLA as function of the frequency |
| 41 | Figure D.4 – Induced internal electric field and associated limit levels |
| 42 | D.2.3 Induced electric field due to the electric field; Ecap(fi,d) Figure D.5 – Example of magnetic-field test result using the LLA |
| 43 | Figure D.6 – Distances of the head and measurement set-up Figure D.7 – Plot of Equation (D.20) |
| 44 | Table D.2 – Calculation main contributions |
| 45 | D.3 Thermal effects from 100 kHz to 300 GHz D.3.1 General Table D.3 – Frequency steps for the amplitude addition that equals 1,11 times B6 |
| 46 | D.3.2 The 100 kHz to 30 MHz contribution to the thermal effects Table D.4 – Frequency steps for the power addition that equals 0,833 times B6 |
| 47 | D.3.3 The 30 MHz to 300 MHz contribution to the thermal effects Figure D.8 – Example of the CM-current measured using a conducted emission test Table D.5 – Field strength limits according to CISPR 15 |
| 48 | D.3.4 Overall conclusion for the contribution to thermal effects |
| 49 | Annex E (normative) Practical internal electric-field measurement and assessment method E.1 Measurement of induced internal electric field E.2 Calculation program |
| 50 | E.3 Compliance criterion for the Van der Hoofden head test Table E.1 – Conductivity as a function of frequency (see Table C.1 of IEC 62311:2007) |
| 51 | Annex F (normative) Protection network F.1 Calibration of the protection network Figure F.1 – Test set-up for normalization of the network analyser |
| 52 | F.2 Calculation of the theoretical characteristic of the protection network Figure F.2 – Test set-up for measurement of the voltage division factor using a network analyser |
| 53 | Figure F.3 – Calculated theoretical characteristic for the calibration of the protection network |
| 54 | Annex G (informative) Measurement instrumentation uncertainty Table G.1 – Uncertainty calculation for the measurement method described in Clauses 5 and 6 in the frequency range from 20 kHz to 10 MHz |
| 55 | Table G.2 – Comments and information to Table G.1 |
| 56 | Annex H (informative) Equipment deemed to comply |
| 57 | Figure H.1 – Flow chart to determine applicability deemed to comply without F factor measurement |
| 58 | Annex I (informative) Intentional radiators I.1 General I.2 Intentional radiators in lighting equipment I.3 Properties of antennas in lighting applications |
| 59 | Table I.1 – Overview of wireless radio technologies that might be applied in lighting systems |
| 60 | Figure I.1 – Luminaire with a transmitting antenna in a room |
| 61 | Figure I.2 – Impact of a conducting ceiling/plane |
| 62 | Figure I.3 – Electric field of a small electrical dipole: analytical formula vs far-field approximation |
| 63 | Figure I.4 – Electric field as a function of distance, antenna gain and input power (far-field approximation) |
| 64 | I.4 Exposure assessment approach I.4.1 General I.4.2 Determination of average total radiated power Pint,rad Figure I.5 – Impact of pulsed signals on the average exposure |
| 65 | I.4.3 Determination of the low-power exclusion level Pmax I.5 Multiple transmitters in a luminaire |
| 66 | I.6 Exposure to multiple luminaires I.7 References in Annex I |
| 68 | Bibliography |
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