BS EN 60444-6:2013
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Measurement of quartz crystal unit parameters – Measurement of drive level dependence (DLD)
Published By | Publication Date | Number of Pages |
BSI | 2013 | 24 |
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
PDF Catalog
PDF Pages | PDF Title |
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6 | English CONTENTS |
7 | INTRODUCTION |
8 | 1 Scope 2 Normative references 3 DLD effects 3.1 Reversible changes in frequency and resistance 3.2 Irreversible changes in frequency and resistance |
9 | 3.3 Causes of DLD effects 4 Drive levels for DLD measurement |
10 | 5 Test methods 5.1 Method A (Fast standard measurement method) 5.1.1 Testing at two drive levels 5.1.2 Testing according to specification |
11 | 5.2 Method B (Multi-level reference measurement method) Figure 1 – Maximum tolerable resistance ratio γ for the drive level dependence as a function of the resistances Rr2 or Rr3 |
13 | Annex A (normative) Relationship between electrical drive level and mechanical displacement of quartz crystal units |
16 | Annex B (normative) Method C: DLD measurement with oscillation circuit Figure B.1 – Insertion of a quartz crystal unit in an oscillator |
17 | Figure B.2 – Crystal unit loss resistance as a function of dissipated power |
18 | Figure B.3 – Behaviour of the Rr of a quartz crystal units Figure B.4 – Block diagram of circuit system |
19 | Figure B.5 – Installed −Rosc in scanned drive level range Figure B.6 – Drive level behavior of a quartz crystal unit if −Rosc = 70 Ω is used as test limit in the “Annex B” test |
20 | Figure B.7 – Principal schematic diagram of the go/no-go test circuit |
21 | Bibliography |