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BS EN 16603-20-08:2014

BS EN 16603-20-08:2014

$215.11

Space engineering – Photovoltaic assemblies and components

Published By Publication Date Number of Pages
BSI 2014 198
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This Standard specifies the general requirements for the qualification, procurement, storage and delivery of photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes suitable for space applications.

This standard does not cover the particular qualification requirements for a specific mission.

This Standard primarily applies to qualification approval for photovoltaic assemblies, solar cell assemblies, bare solar cells, coverglasses and protection diodes, and to the procurement of these items.

This standard is limited to crystaline Silicon and single and multi-junction GaAs solar cells with a thickness of more than 50 μm and does not include thin film solar cell technologies and poly-crystaline solar cells.

This Standard does not cover the concentration technology, and especially the requirements related to the optical components of a concentrator (e.g. reflector and lens) and their verification (e.g. collimated light source).

This Standard does not apply to qualification of the solar array subsystem, solar panels, structure and solar array mechanisms.

This standard may be tailored for the specific characteristic and constrains of a space project in conformance with ECSS-S-ST-00.

PDF Catalog

PDF Pages PDF Title
31 5.3.2.1 Outgassing
5.3.2.2 Toxicity
32 5.3.2.3 Flammability
5.3.2.4 Corrosion
5.3.2.5 Magnetism
5.3.2.6 Erosion
5.3.2.7 Atomic oxygen (ATOX)
5.3.3.1 Cell integration
33 5.3.3.2 Stringing
5.3.3.3 Cell interspacing
5.3.3.4 Sectioning
5.3.3.5 Reverse bias protection
5.3.3.6 Insulation
34 5.3.3.7 Derating
5.3.3.8 Redundancy
5.3.3.9 Fault tolerance
5.3.3.10 Fatigue resistance
35 5.3.3.11 Adherence to substrate
5.3.3.12 Adhesive uniformity
5.3.3.13 Electrostatic discharge (ESD)
5.3.3.14 Electromagnetic compatibility (EMC)
5.3.3.15 Repairability
36 5.4.3.1 Overview
5.4.3.2 Mass measurement
5.4.3.3 Wet insulation test
37 5.4.3.4 Adherence to substrate
5.4.3.5 Visual inspection
5.4.3.6 Continuity check
38 5.5.1.1 Purpose
5.5.1.2 Process
39 5.5.1.3 Fatigue thermal cycling test
42 5.5.1.4 Humidity
43 5.5.1.5 Electrostatic discharge (ESD) test
5.5.1.6 Erosion of materials
5.5.1.7 EMC
5.5.2.1 Purpose
5.5.2.2 Applicability
44 5.5.2.3 Deliverables
5.5.2.4 Process
5.5.3.1 Add-on mass measurement
5.5.3.2 Full visual inspection
50 5.5.3.3 Electrical health check
51 5.5.3.4 Electrical performance measurement
52 5.5.3.5 Capacitance test
5.5.3.6 Bake-out
53 5.5.3.7 Thermal cycling acceptance test
5.5.3.8 Reflectance
54 5.5.3.9 X-Ray
5.5.3.10 Substrate integrity
5.5.3.11 Vacuum thermal cycling
59 6.3.3.1 Purpose
6.3.3.2 Process
6.3.3.3 Pass-fail criteria
61 6.4.2.1 Production and test schedule
6.4.2.2 Qualification test samples
6.4.2.3 Qualification testing
62 6.4.3.1 Visual inspection (VI)
64 6.4.3.2 Dimensions and weight (DW)
65 6.4.3.3 Electrical performance (EP)
66 6.4.3.4 Temperature coefficients (TC)
6.4.3.5 Spectral response (SR)
67 6.4.3.6 Thermo-optical data (TO)
68 6.4.3.7 Thermal cycling (CY)
6.4.3.8 Humidity and temperature (HT)
6.4.3.9 Coating adherence (CA)
69 6.4.3.10 Interconnector adherence (IA)
6.4.3.11 Electron irradiation (EI)
70 6.4.3.12 Photon irradiation and temperature annealing (PH)
71 6.4.3.13 Surface conductivity (SC)
6.4.3.14 Solar Cell Reverse Bias Test (RB)
6.4.3.15 Ultraviolet exposure test (UV)
72 6.4.3.16 Capacitance test (CT)
73 6.4.3.17 Flatness test (FT)
6.4.3.18 Life test (LT)
75 7.1.1.1 Tests for qualification and procurement
7.1.1.2 Conditions and methods of tests
76 7.1.1.3 Responsibility of supplier for the performance of tests and inspections
7.1.1.4 Preliminary characterization
78 7.3.2.1 Test other than electrical performance
7.3.2.2 Electrical performance
81 7.4.2.1 Production and test schedule
7.4.2.2 Qualification test samples
7.4.2.3 Qualification testing
82 7.5.1.1 Applicability
7.5.1.2 Test process
7.5.1.3 Deviations
7.5.1.4 Solar cell defects
83 7.5.1.5 Solar cell contact area defects
84 7.5.3.1 Purpose
7.5.3.2 Process
86 7.5.5.1 Purpose
7.5.5.2 Process
7.5.6.1 Overview
87 7.5.6.2 Hemispherical reflectance (HR)
7.5.6.3 Coverglass gain-loss (GL)
7.5.6.4 Solar absorptance (as)
7.5.7.1 HT1 for qualification testing (subgroup O)
88 7.5.7.2 HT2 for qualification (subgroup A) and acceptance testing
7.5.8.1 Purpose
7.5.8.2 Process
89 7.5.9.1 Purpose
7.5.9.2 Process
7.5.9.3 Pass fail criteria
7.5.10.1 Purpose
7.5.10.2 Process
7.5.10.3 Pass fail criteria
7.5.11.1 Purpose
7.5.11.2 Process
90 7.5.11.3 Pass fail criteria
7.5.12.1 Purpose
7.5.12.2 Process
7.5.13.1 Purpose
7.5.13.2 Process
91 7.5.14.1 Purpose
7.5.14.2 Process
92 7.5.15.1 Purpose
7.5.15.2 Process
7.5.16.1 Purpose
7.5.16.2 Process
93 7.5.16.3 Pass-fail criteria
7.5.17.1 Purpose
7.5.17.2 Process
7.5.18.1 Purpose
7.5.18.2 Process
7.5.19.1 Purpose
7.5.19.2 Process
7.5.19.3 Pass/fail criteria.
97 8.3.1.1 Tests for qualification and procurement
8.3.1.2 Conditions and methods of tests
8.3.1.3 Responsibility of supplier for the performance of tests and inspections
100 8.6.2.1 Production and test schedule
8.6.2.2 Qualification test samples
8.6.2.3 Qualification testing
102 8.7.1.1 General
8.7.1.2 Deviations
8.7.1.3 Defects
104 8.7.3.1 Bulk and surface resistivity
8.7.3.2 Refractive index
8.7.4.1 Dimension and weight
105 8.7.4.2 Density
8.7.4.3 Thickness
8.7.4.4 Edge parallelism
8.7.4.5 Perpendicularity of sides
8.7.5.1 Reflectance
106 8.7.5.2 Reflectance cut-on
8.7.5.3 Reflectance cut-off
8.7.5.4 Reflectance bandwidth
108 8.7.11.1 HT1 for qualification testing (subgroup O)
109 8.7.11.2 HT2 for acceptance testing
8.7.12.1 Purpose
8.7.12.2 Process
110 8.7.13.1 Purpose
8.7.13.2 Process
8.7.14.1 Purpose
8.7.14.2 Process
113 9.2.1.1 Tests for qualification and procurement
114 9.2.1.2 Conditions and methods of tests
9.2.1.3 Responsibility of supplier for the performance of tests and inspections
115 9.2.2.1 Integral protection diodes
9.2.2.2 External protection diodes
117 9.4.5.1 Production and test schedule
9.4.5.2 Diode characterization for acceptance (DCA)
120 9.5.4.1 Production and test schedule
121 9.5.4.2 Qualification test samples
9.5.4.3 Qualification testing
9.6.2.1 Applicability
122 9.6.2.2 Test process
9.6.2.3 Deviations
9.6.2.4 Protection diode defects
9.6.2.5 External protection diode contact area defects
123 9.6.4.1 Purpose
9.6.4.2 Process
9.6.5.1 Purpose
9.6.5.2 Process
124 9.6.6.1 Purpose
9.6.6.2 Process
9.6.7.1 Purpose
9.6.7.2 Process
9.6.7.3 Pass Fail Criteria
125 9.6.8.1 Purpose
9.6.8.2 Process
9.6.8.3 Pass Fail Criteria
9.6.9.1 Purpose
9.6.9.2 Process
9.6.9.3 Pass Fail Criteria
9.6.10.1 Purpose
126 9.6.10.2 Process
9.6.11.1 Purpose
9.6.11.2 Process
9.6.12.1 Purpose
9.6.12.2 Process
127 9.6.13.1 Purpose
9.6.13.2 Process
9.6.14.1 Purpose
128 9.6.14.2 Process
9.6.15.1 Purpose
9.6.15.2 Process
129 9.6.15.3 Pass-fail criteria
9.6.16.1 Purpose
9.6.16.2 Process
9.6.16.3 Pass-fail criteria
130 9.6.17.1 Purpose
9.6.17.2 Process
132 9.6.17.3 Pass-fail criteria
9.6.18.1 Purpose
9.6.18.2 Process
134 9.6.18.3 Pass-fail criteria
136 10.1.1.1 AM0 spectrum
10.1.1.2 Total Irradiance of the Sun simulator
10.1.1.3 Spectral distribution of the Sun simulator
146 10.2.2.1 Selection of secondary working standards
10.2.2.2 Irradiated secondary working standards
10.2.2.3 Secondary working standards performance requirements
148 10.2.6.1 Sun simulator calibration
10.2.6.2 Sun simulator maintenance
149 11.1.1.1 Introduction
11.1.1.2 Description
150 11.1.3.1 Preparation of the measurement equipment
151 11.1.3.2 Process for calibration of the test equipment
153 11.1.3.3 Measurement of the cell with the network analyser
154 11.1.4.1 Correction of the measurement with respect to the actual impedance of the shunt (impedance values from the B/A measurements)
11.1.4.2 Modelling
157 11.2.1.1 Introduction
158 11.2.1.2 Description
11.2.2.1 Measurement equipment set-up
159 11.2.2.2 Calibration of the measurement equipment
11.2.2.3 Performance measurement
11.2.2.4 Data processing

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BS EN 16603-20-08:2014
$215.11