ASTM-F1340:1992 Edition

$40.63

F1340-92 Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)

Published By	Publication Date	Number of Pages
ASTM	1992

Guaranteed Safe Checkout

Categories: 31.080.30 - Transistors, ASTM

If you have any questions, feel free to reach out to our online customer service team by clicking on the bottom right corner. We’re here to assist you 24/7.
Email:[email protected]

Description

ASTM F1340-92

Withdrawn Standard: Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)

ASTM F1340

Scope

Keywords

ICS Code

ICS Number Code 31.080.30 (Transistors)

DOI:

Additional information

Standard Title	F1340-92 Test Method for Determining the Mean Interface Trap Density of Mosfets by Charge-Pumping (Withdrawn 1997)
Published Code	ASTM
Publication Date	1992
ICS Codes	31.080.30 - Transistors