AS ISO 19319:2006
$35.75
Surface chemical analysis – Augur electron spectroscopy and X-ray photoelectron spectroscopy – Determination of lateral resolution, analysis area and sample area viewed by the analyser
| Published By | Publication Date | Number of Pages |
| AS | 2006-10-20 | 28 |
Adopts ISO 19319:2003 to provide information for measuring lateral analysis, the analysis area and the sample area viewed by the analyser in Auger electron spectroscopy and X-ray photoelectron spectroscopy.
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