{"id":408371,"date":"2024-10-20T05:30:20","date_gmt":"2024-10-20T05:30:20","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-en-iec-60512-27-2002022\/"},"modified":"2024-10-26T10:01:05","modified_gmt":"2024-10-26T10:01:05","slug":"bs-en-iec-60512-27-2002022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-en-iec-60512-27-2002022\/","title":{"rendered":"BS EN IEC 60512-27-200:2022"},"content":{"rendered":"

IEC 60512-27-200:2022 is primarily intended for use in signal integrity and transmission performance testing up to 2 000 MHz of IEC 60603-7 series 8-way connector type IEC 60603\u20117\u201181, according to connector test method IEC 60512\u201128\u2011100. This part of IEC 60512 covers additional, supplemental test method specifications to extend the upper frequency for the test connectors and associated indirect-reference test fixtures used in the signal integrity and transmission performance tests specified in IEC 60512\u201127\u2011100. In support of de-embedded crosstalk and related transmission requirements specified in IEC 60603\u20117\u201181, for frequencies up to 2 000 MHz, these supplemental specifications extend the upper test frequency from IEC 60512\u201127\u2011100 up to 500 MHz to the upper test frequency of IEC 60512\u201128\u2011100 up to 2 000 MHz. This document covers measurements of connector signal integrity and transmission performance of 8-way connector types defined in these published connector series standards: – IEC 60603\u20117\u20112 – IEC 60603\u20117\u20113 – IEC 60603\u20117\u20114 – IEC 60603\u20117\u20115 – IEC 60603\u20117\u201141 – IEC 60603\u20117\u201151 – IEC 60603\u20117\u201181. This document covers respective performance test procedures of connector signal integrity and transmission performance defined in these published connector test method series standards: – IEC 60512\u201126\u2011100 – IEC 60512\u201127\u2011100 – IEC 60512\u201128\u2011100.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
7<\/td>\nAnnex ZA (normative)Normative references to international publicationswith their corresponding European publications <\/td>\n<\/tr>\n
9<\/td>\nEnglish
CONTENTS <\/td>\n<\/tr>\n
11<\/td>\nFOREWORD <\/td>\n<\/tr>\n
13<\/td>\nINTRODUCTION <\/td>\n<\/tr>\n
14<\/td>\n1 Scope <\/td>\n<\/tr>\n
15<\/td>\n2 Normative references <\/td>\n<\/tr>\n
16<\/td>\n3 Terms and definitions
4 Test connector specifications
4.1 General <\/td>\n<\/tr>\n
17<\/td>\n4.2 Indirect-reference test fixtures
Tables
Table 1 \u2013 IEC 606037 series, 8-way connector types standards and respective connector test method standards <\/td>\n<\/tr>\n
18<\/td>\n4.3 Category 8.1 test plug requirements
4.3.1 General
4.3.2 Category 8.1 test plug NEXT loss requirements
4.3.3 Category 8.1 test plug return loss requirements
Table 2 \u2013 Category 8.1 test plug NEXT loss ranges <\/td>\n<\/tr>\n
19<\/td>\n4.4 Category 8.1 cord test head requirements
4.4.1 General
4.4.2 Category 8.1 cord test head return loss
Table 3 \u2013 Category 8.1 test plug return loss requirements
Table 4 \u2013 Category 8.1 cord test head return loss <\/td>\n<\/tr>\n
20<\/td>\nAnnex A (informative) Test connectors specifications
A.1 General
A.2 Test plug specifications
A.2.1 General
A.2.2 Test plug NEXT loss limit vectors
Table A.1 \u2013 Category 6, 6A and 8.1 test plug NEXT loss limit vectors <\/td>\n<\/tr>\n
21<\/td>\nA.2.3 Mated connector NEXT loss specifications
A.2.4 Test plug NEXT loss specifications
Table A.2 \u2013 Category 5e test plug NEXT loss limit vectors
Table A.3 \u2013 Category 6, 6A and 8.1 mated connector NEXT loss specificationsfor case 1 and case 4 <\/td>\n<\/tr>\n
22<\/td>\nTable A.4 \u2013 Category 5e, 6, and 6A test plug NEXT loss ranges <\/td>\n<\/tr>\n
23<\/td>\nA.2.5 Test plug phase reference plane and calibration planes
Table A.5 \u2013 Category 8.1 test plug NEXT loss ranges <\/td>\n<\/tr>\n
24<\/td>\nA.2.6 Device delay measurements
Figures
Figure A.1 \u2013 Calibration planes, test plug phase reference plane, and port extensions <\/td>\n<\/tr>\n
26<\/td>\nA.3 Cord test head specifications
A.3.1 General
A.3.2 Cord test head NEXT loss, centred
A.3.3 Cord test head FEXT loss
A.3.4 Cord test head return loss
Table A.6 \u2013 Category 5e, 6, and 6A cord test head return loss <\/td>\n<\/tr>\n
27<\/td>\nTable A.7 \u2013 Category 8.1 cord test head return loss <\/td>\n<\/tr>\n
28<\/td>\nAnnex B (informative) Balun measurement procedures use of test plugs and test heads
B.1 General
B.2 Example balun measurement test configuration for permanent link insertion loss
B.3 Example balun measurement test configuration for direct attach cord insertion loss
Figure B.1 \u2013 Example balun measurement test configuration forpermanent link insertion loss <\/td>\n<\/tr>\n
29<\/td>\nFigure B.2 \u2013 Example balun measurement test configuration fordirect attach cord insertion loss <\/td>\n<\/tr>\n
30<\/td>\nAnnex C (informative) Balunless measurement procedures use of test plugs and test heads
C.1 General
C.2 Example balunless measurement test configuration for permanent link insertion loss
C.3 Example balunless measurement test configuration for direct attach cord insertion loss
Figure C.1 \u2013 Example balunless measurement test configuration forpermanent link insertion loss <\/td>\n<\/tr>\n
31<\/td>\nFigure C.2 \u2013 Example balunless measurement test configuration fordirect attach cord insertion loss <\/td>\n<\/tr>\n
32<\/td>\nAnnex D (informative) Connector test fixtures
D.1 General
D.2 Overall test setup
Table D.1 \u2013 Overall test setup specifications <\/td>\n<\/tr>\n
33<\/td>\nD.3 Indirect-reference test fixtures
D.3.1 Indirect-reference test fixtures basic specifications
D.3.2 Indirect-reference test fixtures additional specifications
D.4 Direct-probe test fixtures
D.4.1 Direct-probe test fixtures basic specifications
D.4.2 Direct-probe test fixtures additional specifications <\/td>\n<\/tr>\n
34<\/td>\nD.4.3 Direct-probe test fixtures for test plug measurements
Table D.2 \u2013 Direct-probe test fixture general specifications
Table D.3 \u2013 Direct probe fixture for test plugs measurements \u2013 specifications <\/td>\n<\/tr>\n
35<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Connectors for electrical and electronic equipment. Tests and measurements – Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors. Tests 27a to 27g<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2022<\/td>\n36<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":408380,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[587,2641],"product_tag":[],"class_list":{"0":"post-408371","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-31-220-10","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/408371","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/408380"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=408371"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=408371"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=408371"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}