{"id":397713,"date":"2024-10-20T04:31:51","date_gmt":"2024-10-20T04:31:51","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/ieee-1671-6-2015-2\/"},"modified":"2024-10-26T08:19:58","modified_gmt":"2024-10-26T08:19:58","slug":"ieee-1671-6-2015-2","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/ieee\/ieee-1671-6-2015-2\/","title":{"rendered":"IEEE 1671.6-2015"},"content":{"rendered":"
Revision Standard – Active. An exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
---|---|---|---|---|---|---|---|
1<\/td>\n | IEEE Std 1671.6\u2122-2015 Front cover <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | Title page <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | Important notices and disclaimers concerning IEEE standards documents <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Participants <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | Contents <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | Important notice 1. Overview 1.1 General <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 1.2 Application of this document\u2019s annexes 1.3 Scope 1.4 Application 1.5 Conventions used within this document <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 2. Normative references <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 3. Definitions, acronyms, and abbreviations 3.1 Definitions <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 3.2 Acronyms and abbreviations <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 4. Schema\u2014TestStationDescription.xsd 4.1 General 4.2 Elements <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 4.3 Child elements <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 4.4 Complex types <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 5. Schema\u2014TestStationInstance.xsd 5.1 General 5.2 Elements <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 5.3 Child elements 5.4 Complex types <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 6. ATML TestStationDescription XML schema names and locations <\/td>\n<\/tr>\n | ||||||
25<\/td>\n | 7. ATML XML schema extensibility <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 8. Conformance 8.1 Conformance of a TestStationDescription instance document 8.2 Conformance of a TestStationInstance instance document <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | Annex A (informative) IEEE download website material associated with this document <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | Annex B (informative) User’s information and examples B.1 Partial automatic test station <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | Annex C (informative) Glossary <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | Annex D (informative) Bibliography <\/td>\n<\/tr>\n | ||||||
34<\/td>\n | Back cover <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description<\/b><\/p>\n |