{"id":375857,"date":"2024-10-20T02:45:36","date_gmt":"2024-10-20T02:45:36","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-cen-ts-176292021\/"},"modified":"2024-10-26T04:50:42","modified_gmt":"2024-10-26T04:50:42","slug":"bsi-pd-cen-ts-176292021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-cen-ts-176292021\/","title":{"rendered":"BSI PD CEN\/TS 17629:2021"},"content":{"rendered":"
This document specifies a method for measuring the scratch resistance and failure behaviour for advanced materials and coatings by means of nano- and micro- scale scratch experiments. The method provides data on both the physical damage to test-pieces and the friction generated between the probe and the test-piece under single pass and multiple pass conditions. The force range in these tests is from 1 \u03bcN up to 2 N. The test method is not applicable to coatings as defined in EN ISO 4618 [18].<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
6<\/td>\n | European foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4 Symbols and abbreviations <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 5 Principle 5.1 General 5.2 Friction <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5.3 Factors influencing the critical forces 5.3.1 General 5.3.2 Probe radius <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 5.3.3 Scan speed and loading rate 5.3.4 Roughness 5.4 Multiple pass testing <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 6 Apparatus and materials 6.1 Apparatus 6.1.1 General 6.1.2 Generation and control of motion <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 6.1.3 Holding test-pieces 6.1.4 Application of normal force 6.1.5 Tangential force measurement 6.1.6 Post-test evaluation of damage <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6.2 Probes 6.2.1 Geometry <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | 6.2.2 Probe evaluation 6.2.3 Periodic assessment of changes to probe 6.2.4 Probe material 6.2.5 Probe cleaning 6.3 Test environment 6.3.1 Temperature <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | 6.3.2 Humidity 6.3.3 Atmosphere 7 Preparation of test-pieces 7.1 Roughness 7.2 Test-piece cleaning <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 8 Test procedures 8.1 General 8.2 Zero-point determination <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 8.3 Test force 8.4 Test profiles 8.4.1 General 8.4.2 Pre-scan 8.4.3 Post-scan 8.4.4 Hold periods 8.5 Test procedures 8.5.1 General <\/td>\n<\/tr>\n | ||||||
22<\/td>\n | 8.5.2 Procedure A: Single pass with constant force <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 8.5.3 Procedure B: Single pass ramping force <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 8.5.4 Procedure C: Multiple pass with constant force <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 8.5.5 Procedure D: Multiple pass ramping force <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 9 Analysis of results 9.1 General 9.2 Single pass ramping force 9.2.1 Assignment of the critical force 9.2.2 Interpretation of a 3-pass scratch test topographical profiles <\/td>\n<\/tr>\n | ||||||
29<\/td>\n | 9.2.3 Analysis of damage for a 3-pass scratch test <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | 9.3 Single pass constant force 9.4 Multi-pass ramping force 9.5 Multi-pass constant force <\/td>\n<\/tr>\n | ||||||
31<\/td>\n | 10 Test reproducibility, repeatability and limits <\/td>\n<\/tr>\n | ||||||
32<\/td>\n | 11 Test report <\/td>\n<\/tr>\n | ||||||
33<\/td>\n | Annex A (normative) Procedures for determination of probe area function or radius function <\/td>\n<\/tr>\n | ||||||
38<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Nanotechnologies. Nano- and micro- scale scratch testing<\/b><\/p>\n |