IEC 60749-37:2008
$33.15
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques – Partie 37 : méthode d’essai de chute au niveau de la carte avec utilisation d’un accéléromètre
| Published By | Publication Date | Number of Pages |
| IEC | 2008-01-30 | 44 |
| Published Code | IEC |
|---|---|
| Published By | International Electrotechnical Commission |
| Publication Date | 2008-01-30 |
| Pages Count | 44 |
| Language | France |
| Edition | 1.0 |
| File Size | 1.0 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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