UNE-EN 62374-1:2010:2011 Edition
$21.45
Semiconductor devices — Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
| Published By | Publication Date | Number of Pages |
| AENOR | 2011-03-01 | 19 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2011-03-01 |
| Pages Count | 19 |
| Language | English |
| File Size | 532.5 KB |
| ICS Codes | 31.080 - Semiconductor devices |
