ISO 21270:2004
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Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
Published By | Publication Date | Number of Pages |
ISO | 2004-06 | 20 |
ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.