IEC 60749-13:2018

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Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

Published By	Publication Date	Number of Pages
IEC	2018-02-15	32

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Categories: 31.080.01 - Semiconductor devices in general, IEC

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Description

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Additional information

Published Code	IEC
Published By	International Electrotechnical Commission
Publication Date	2018-02-15
Pages Count	32
Language	France
Edition	2.0
File Size	1.1 MB
ICS Codes	31.080.01 - Semiconductor devices in general

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IEC 60749-13:2018

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