BS IEC 60748-23-1:2002
$215.11
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Generic specification
| Published By | Publication Date | Number of Pages |
| BSI | 2002 | 88 |
Applies to high quality hybrid integrated circuits (with films) incorporating special customer quality and reliability requirements. Hybrid integrated circuits may be fully or partly completed. Partly completed devices are those that may be supplied to customers for further processing.
Related products
-
BS EN IEC 60749-39:2022
Semiconductor devices. Mechanical and climatic test methods – Measurement of moisture diffusivity and water solubility…
-
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BS EN 60749-18:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Ionizing radiation (total dose) Published By Publication…
-
BS EN 60749-37:2008
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
-
BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Blank…
-
BS EN IEC 60749-10:2022
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock. device and subassembly Published By…
-
BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BS EN 60745-2-23:2013
Hand-held motor-operated electric tools. Safety – Particular requirements for die grinders and small rotary tools…
-
BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods – High temperature operating life Published By Publication…
-
BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing. Charged device…
-
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods – Board level drop test method using an…
-
BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
-
BS IEC 60748-23-2:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Internal…
-
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS EN 60749-30:2005+A1:2011
Semiconductor devices. Mechanical and climatic test methods – Preconditioning of non-hermetic surface mount devices prior…
-
BSI PD CISPR/TR 16-4-1:2003:2008 Edition
Specification for radio disturbance and immunity measuring apparatus and methods – Uncertainties, statistics and limit…
-
BS EN 60749-17:2003:2004 Edition
Semiconductor devices. Mechanical and climatic test methods – Neutron irradiation Published By Publication Date Number…
-
BS EN IEC 60747-17:2020
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS IEC 60747-7:2010+A1:2019
Semiconductor devices. Discrete devices – Bipolar transistors Published By Publication Date Number of Pages BSI…
-
BS EN 60749-20:2009 2010
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…
-
BS EN 60749-39:2006
Semiconductor devices. Mechanical and climatic test methods – Measurement of moisture diffusivity and water solubility…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN 60740-1:2005
Laminations for transformers and inductors – Mechanical and electrical characteristics Published By Publication Date Number…
-
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS EN 60749-10:2002
Semiconductor devices. Mechanical and climatic test methods – Mechanical shock Published By Publication Date Number…
-
BS EN 60598-2-18:1994+A1:2012
Luminaires – Particular requirements. Luminaires for swimming pools and similar applications Published By Publication Date…
-
BS EN 60747-16-3:2002+A2:2017:2018 Edition
Semiconductor devices – Microwave integrated circuits. Frequency converters Published By Publication Date Number of Pages…
-
BS EN 60749-15:2010:2011 Edition
Semiconductor devices. Mechanical and climatic test methods – Resistance to soldering temperature for through-hole mounted…
-
BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification – Manufacturers’…
-
BS EN 60746-1:2003
Expression of performance of electrochemical analyzers – General Published By Publication Date Number of Pages…
-
BS EN 60749-12:2002
Semiconductor devices. Mechanical and climatic test methods – Vibration, variable frequency Published By Publication Date…
-
BS IEC 60748-23-5:2003 2004
Semiconductor devices. Integrated circuits – Hybrid integrated circuits and film structures. Manufacturing line certification. Procedure…
-
BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods – Resistance to soldering temperature for through-hole mounted…
-
BS EN 60749:1999:2002 Edition
Semiconductor devices. Mechanical and climatic test methods Published By Publication Date Number of Pages BSI…
-
BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods – Resistance of plastic encapsulated SMDs to the…
-
BS EN 60749-28:2017
Semiconductor devices. Mechanical and climatic test methods – Electrostatic discharge (ESD) sensitivity testing. Charged device…
-
BS EN 60598-2-18:1994+A1:2012:2013 Edition
Luminaires – Particular requirements. Luminaires for swimming pools and similar applications Published By Publication Date…
-
BS EN IEC 60747-17:2020:2021 Edition
Semiconductor devices – Magnetic and capacitive coupler for basic and reinforced insulation Published By Publication…
-
BS EN 60749-13:2002
Semiconductor devices. Mechanical and climatic test methods – Salt atmosphere Published By Publication Date Number…
