BS EN 12698-2:2007

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Chemical analysis of nitride bonded silicon carbide refractories – XRD methods

Published By	Publication Date	Number of Pages
BSI	2007	16

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Description

This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer. It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and SiAlON are described. NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.

Additional information

Status	Confirmed
Pages	16
Publication Date	2007-05-31
ISBN	978 0 580 50666 6
Standard Number	BS EN 12698-2:2007
Title	Chemical analysis of nitride bonded silicon carbide refractories – XRD methods
Identical National Standard Of	EN 12698-2:2007
Descriptors	Test specimens, Refractory materials, Bonding, Diffractometry, Nitrides, Silicon inorganic compounds, Refractories, Chemical analysis and testing, Carbides
Publisher	BSI
Committee	RPI/1
ICS Codes	81.080 - Refractories

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BS EN 12698-2:2007

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