UNE-EN 60749-44:2016
$22.75
Semiconductor devices – Mechanical and climatic test methods – Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
| Published By | Publication Date | Number of Pages |
| AENOR | 2016-12-01 | 28 |
| Published Code | AENOR |
|---|---|
| Published By | Asociación Española de Normalización |
| Publication Date | 2016-12-01 |
| Pages Count | 28 |
| Language | English |
| File Size | 1.5 MB |
| ICS Codes | 31.080.01 - Semiconductor devices in general |
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